Verification of timed circuits with failure directed abstractions

Hao Zheng, Chris Myers, David Walter, Scott Little, Tomohiro Yoneda
October 2003
Type
Conference paper
Publication
IEEE International Conference on Computer Design
Hao Zheng
Hao Zheng
University of South Florida, Associate Professor
Chris Myers
Chris Myers
Department Chair / Professor
David Walter
David Walter
Amazon (AWS S3), Senior SDE
Scott Little
Scott Little
Maxim Integrated, EDA

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